An electronic assembly is subjected to a final functional test. Suppose that defects occur at random in these assemblies, and that these defects occur according to a Poisson distribution with parameter .
i. What is the probability that an assembly will have exactly one defect?
ii. What is the probability that an assembly will have one or more defects?
iii. Suppose that you improve the process so that the occurrence rate of defects is
reduced to . What effect will this have on the probability that an
assembly will have one or more defects?

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